633 nm SLM Laser

Item Code: 0633L-21A-NI-NT-NF
VBG Diode Free-space
Filter
Preliminary
Product specifications are subject to change, delivery time is less predictable.
Full production
Product specifications are stable. Delivery time is predictable.
Replacement in due course
The product is to be replaced. Please contact us regarding forseeable changes
Not for new designs
The product is to be discontinued. Please contact us for production plans.
Orders still accepted, deliveries still possible
The product will be discontinued soon but we still have some stock of finished items or neccessary components.
No more orders accepted
Some products might be reserved for in-warranty replacement and outstanding orders.
Discontinued
The product is no longer available. Please contact us regarding alternatives or custom solutions.
Available (in stock) Not in stock

Description

Compact 633 nm single longitudinal mode (SLM) diode laser, the modern replacement for traditional HeNe lasers, tailored to elevate your Raman spectroscopy endeavors. This laser is meticulously engineered for reliability and precision. Compact design and high stability make it the perfect choice for Raman spectroscopy applications, where the need for dependable and versatile light sources is paramount. Robust performance and stability ensure accurate results, making it the ideal tool for researchers and scientists eager to unlock the mysteries of molecular vibrational modes and achieve exceptional spectral data.

Small footprint and +5 VDC operating voltage is exactly what's needed for handheld portable devices. Integrated precision driver electronics ensure low-noise and very stable operation throughout the wide temperature range. VBG technology delivers a low-cost solution to sophisticated Raman spectroscopy and various metrology needs. 

Note:
Back-reflections to the laser can cause spectral widening or even a COD (Catastrophic Optical Damage) of laser diode facet. In optical systems with significant back-reflections (e.g. more than 0.5%), the laser must be protected by using an optical isolator with at least 20 dB isolation. Typical applications include interferometry, confocal microscopy (especially working with reflective samples), etc. Failure to comply with these requirements will render the warranty void.


Last edited on: 3 June 2024
Parameter Minimum Value Typical Value Maximum Value
 Central wavelength, nm 632.6 632.8 632.9
 Longitudinal modes - Single -
 Spectral line width FWHM, MHz 1 - 2 8
 Output power, mW 2 - 70 -
 Side-mode suppression ratio (SMSR), dB - 50 -
 Power stability, % (RMS, 8 hrs) 3 0.01 0.03 0.25
 Power stability, % (peak-to-peak, 8 hrs) 4 0.05 0.15 1
 Intensity noise, % (RMS, 20 Hz to 20 MHz) 5 0.05 0.2 0.6
 Transversal modes - TEM00 -
 Beam width (1/e2), mm 6 - 1 1.3
 Beam height (1/e2), mm - 1.2 1.8
 Horizontal beam divergence, mrad - 1.2 1.5
 Vertical beam divergence, mrad - 0.4 0.8
 M² horizontal axis - 1.2 1.4
 M² vertical axis - 1.3 1.6
 M² effective - 1.3 1.6
 Polarization direction 7 - Horizontal -
 Polarization contrast 1000 1500 -
 Control interface type 8 - UART -
 Operation mode - APC (CW) -
 Modulation bandwidth, MHz 9 - N/A -
 Input voltage, VDC 4.8 5 5.3
 External power supply requirement - +5 V DC, 1.5 A -
 Dimensions (WxDxH), mm 10 - 50 x 30 x 18 -
 Beam height from the base, mm 9.9 10.4 10.9
 Heat-sinking requirement, °C/W - 1 -
 Optimum heatsink temperature, °C 18 25 32
 Warm up time, mins (cold start) 0.2 1 2
 Temperature stabilization - Internal TEC -
 Overheat protection - Yes -
 Storage temperature, °C (non-condensing) -10 - 50
 Net weight, kg 0.1 0.12 0.14
 Max. power consumption, W 0.4 2 10
 Warranty, months (op. hrs) 11 - 14 (10000) -
 RoHS - Yes -
 CE compliance - - General Product Safety Directive (GPSD) 2001/95/EC
- (EMC) Directive 2004/108/EC
-
 Laser safety class - 3B -
 OEM lasers are not compliant with - IEC60825-1:2014 (compliant using additional accessories) -
 Country of origin - Lithuania -
 Spectral line width FWHM, pm 12 - 0.003 0.01

1 Measured using HighFinesse LineWidth Analyzer LWA-10k having 10 kHz resolution. Linewidth Analyzer testing is not provided for each laser being manufactured, the standard test is OSA measurement with 20-30 pm resolution instead.

2 The output power of SLM lasers shall not be tuned and SLM performance is not guaranteed at power ratings other than factory preset. However, the power setting capability is not disabled. External attenuators are recommended instead.

3 The long term power test is carried out at constant laser body temperature (+/-0.1 ‎°C) using an optical power meter with an input bandwidth of 10 Hz. The actual measurement rate has a period of about 20 seconds to 1 minute.

4 The long term power test is carried out at constant laser body temperature (+/-0.1 ‎°C) using an optical power meter with an input bandwidth of 10 Hz. The actual measurement rate has a period of about 20 seconds to 1 minute.

5 Noise level is measured with a fast photodiode connected to an oscilloscope. The overall system bandwidth is from 2 kHz to 20 MHz.

6 Beam width and height are measured at 0.4 m from output aperture.

7 For lasers without integrated optical isolators.

8 Break-out-boxes AM-C8 and AM-C3 can be used for conversion of UART communication to either USB or RS232.

9 SLM lasers shall not be modulated - use external modulators instead.

10 Excluding control interface pins and an output window/fiber assembly.

11 Whichever occurs first. The laser has an integrated operational hours counter.

12 Converted from bandwidth value.

Typical spectrum

Typical spectrum of 0633 nm diode laser. Measured with 20 pm resolution.

Spectrum of 633 nm SLM Laser
Typical spectrum with an integrated clean-up filter

Typical spectrum of 0633 nm diode laser with an integrated clean-up filter. Measured with 20 pm resolution.

Spectrum of 633 nm SLM Laser with an integrated clean-up filter
Drawing

The key dimensions of a free-space MatchBox.

Drawing of 633 nm SLM Laser
Typical Near Field

Typical near field (0.45 m from output aperture) beam profile. Non-circularized beam of a 0633 nm direct diode laser.

Near field beam profile of 633 nm SLM Laser
Typical Far Field

Typical far field (1 m from output aperture) beam profile. Non-circularized beam of a 0633 nm direct diode laser.

Far field beam profile of 633 nm SLM Laser

Raman Spectroscopy

Raman Spectroscopy is a powerful analytical technique that explores molecular vibrations by measuring inelastic scattering of monochromatic light. It provides valuable insights into molecular structure, composition, and chemical bonding, making it widely used in material science, chemistry, and biology. The unique spectral fingerprints obtained through Raman spectroscopy enable non-destructive and precise identification of substances, making it a versatile tool for research and quality control applications.

Quantum Cryptography

Quantum cryptography is a way of securing information using the principles of quantum physics. One method of quantum cryptography is quantum key distribution (QKD), which allows two parties to share a secret key that can encrypt and decrypt messages. QKD uses entangled photons, which are pairs of light particles that have a quantum connection and share the same properties. By measuring the polarization of one photon, the other photon will have the same polarization, even if they are far apart. This way, the two parties can generate a random sequence of bits that form the key. However, to create and send entangled photons from space, they need small lasers that can fit into smallsats.

Photoacoustic imaging

Photoacoustic imaging is a process where powerful laser pulses interact with material by exciting acoustic waves. Similarly, as in ultrasound imaging, the propagating acoustic waves are analyzed by piezo-based detectors (pick-ups), and the complete 3D image is formed by raster scanning or other techniques, such as laser-based holography or interferometry.

This website uses cookies. Learn more
Agree with all cookies